Journals
Sung-Woong Chung, Joo-Han Shin, Nae-Hak Park and Jin Won Park, โDielectric Properties of Hydrogen Silsesquioxane Films Degraded by Heat and Plasma Treatment.โ, Jpn. J. Appl.Phys., Vol.38 (1999) pp.5214-5219.
Sung-Woong Chung, Y. I. Kim, H. L. Park, W. J. Lee, โElectrical properties of the perovskite (Pb, La)TiO3 films deposited by electron cyclotron resonance plasma enhanced chemical vapor depositionโ, Journal of Materials Science: Materials in Electronicsโฏ9(5):383-390, 1998
Sung-Woong Chung, Su-Ock Chung, KS No, Won-Jong Lee, โCrystalline structures of the PbTiO 3 films prepared using the ECR PECVD methodโ, Thin Solid Filmsโฏ295(1):299-304, 1997
Chang Seung Lee, Sung-Woong Chung, Yong-Chun Kim, In-Seop Chung, Dang-Moon Wee, Won-Jong Lee, โGrowth of highly oriented Pt(100) thin films on a MgO(100) seed layer deposited on Si(100) substrates by rf magnetron sputteringโ, Surface and Coatings Technologyโฏ90(3):229-233, 1997
Sung-Woong Chung, Jung-Shik Shin, Jae-Whan Kim, KS No, Sung-Soon Chun, Won-Jong Lee,โCharacterization of PbTiO3 thin films deposited on Pt/Ti/SiO2/Si substrates by ECR PECVDโ, Journal of Materials Researchโฏ10(2):447-452, 1995
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