Conference
“Analysis of Bridge Failure between PPG and LPP in Fin Cell Transistor”
Jungho Lee, Sung-Woong Chung, Seung Pyo Park, Myung Sick Chang, Jung Hoon Lee, Sung-Joo Hong
Conference ISTFA, 2007 p345
“Reliability Studies on Non Planar DRAM Cell Transistor”
Myoung Jin Lee, Seonghoon Jin, Chang-Ki Baek, Sung-Min Hong, Soo-Young Park, Hong-Hyun Park, Sang-Don Lee, Sung-Woong Chung, Jae-Goan Jeong, Sung-Joo Hong, Sung-Wook Park, In-Young Chung, Y.J. Park, Hong Shick Min
Intrenational Reliability physics symposium, 2007.
419-1 C5, 80, Jigok-ro, Nam-gu, Pohang-si, Gyeongsangbuk-do, Republic of Korea [37666]
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