Journals
Sung-Woong Chung, Sang-Tae Ahn, Hyun-Chul Sohn, Sang-Don Lee, “Flowable oxide CVD Process for Shallow Trench Isolation in Silicon Semiconductor”, Journal of Semiconductor Technology and Science Vol.4 No.1, 45-51 (2004)
419-1 C5, 80, Jigok-ro, Nam-gu, Pohang-si,
Gyeongsangbuk-do, Republic of Korea [37666]
swchung@postech.ac.kr
©2023 INNOVATIVE MEMORY PROCESS AND DEVICE. ALL RIGHTS RESERVED.
419-1 C5, 80, Jigok-ro, Nam-gu, Pohang-si, Gyeongsangbuk-do, Republic of Korea [37666]
swchung@postech.ac.kr
©2023 INNOVATIVE MEMORY PROCESS AND DEVICE. ALL RIGHTS RESERVED.